Surveying Instrument Collection
Maker |
CARL ZEISS, Oberkochen, Germany |
Model |
10 mm Plane Parallel Plate Micrometer for Zeiss Ni2 Level |
Serial Number |
n/a |
Dimensions |
75 x 86 x 165 mm |
Image |
|
Description |
This PPP micrometer attaches to the telescope of the Zeiss Ni2 automatic level. It allows to move the line of sight 5 mm up and down. The device is used in precise levelling with invar line staffs graduated at 10 mm intervals. The range of the micrometer is 11 mm. The micrometer is graduated in 0.5 mm steps on the metal readout scale. Interpolation to 0.05 mm is possible. In precise levelling, the staffs are read directly to the centimetre (since each cm line carries a number) and the decimals of the centimetre on the micrometer drum. The double run levelling precision of the Zeiss Ni2 with plane parallel plate micrometer and invar staffs is quoted as ±0.3 mm * SQRT(km). Order Number 704403 Weight: 0.9 kg |
History & comments |
Post 1950. A note inside the container says: "For precision levellings, see Ni2 operating manual, item 70-75" |
Conservation |
In leather tubular container |
Condition |
excellent. Broken strap of carrying container. |
Remarks |
Box marked Fa65, P/C(plat card) 33303 Micrometer engraved "CARL ZEISS Germany" |
Dates |
Catalogued in 2012 by JMR. Photo by JMR. |