Maker

CARL ZEISS, Oberkochen, Germany

Model

10 mm Plane Parallel Plate Micrometer for Zeiss Ni2 Level

Serial Number

n/a

Dimensions

75 x 86 x 165 mm

Image

Description

This PPP micrometer attaches to the telescope of the Zeiss Ni2 automatic level. It allows to move the line of sight 5 mm up and down. The device is used in precise levelling with invar line staffs graduated at 10 mm intervals.

The range of the micrometer is 11 mm. The micrometer is graduated in 0.5 mm steps on the metal readout scale. Interpolation to 0.05 mm is possible.

In precise levelling, the staffs are read directly to the centimetre (since each cm line carries a number) and the decimals of the centimetre on the micrometer drum.

The double run levelling precision of the Zeiss Ni2 with plane parallel plate micrometer and invar staffs is quoted as ±0.3 mm * SQRT(km).

Order Number 704403

Weight: 0.9 kg

History & comments

Post 1950. A note inside the container says: "For precision levellings, see Ni2 operating manual, item 70-75"

Conservation

In leather tubular container

Condition

excellent. Broken strap of carrying container.

Remarks

Box marked Fa65, P/C(plat card) 33303

Micrometer engraved "CARL ZEISS Germany"

Dates

Catalogued in 2012 by JMR. Photo by JMR.